Aberration Corrected STEM in Atomic Resolution and Resolution Enhancement in Low-Voltage Microscope
نویسندگان
چکیده
منابع مشابه
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ژورنال
عنوان ژورنال: Hyomen Kagaku
سال: 2013
ISSN: 0388-5321,1881-4743
DOI: 10.1380/jsssj.34.240